Focused ion beam (FIB) in situ lift-out (INLO) technique showing the

FIB Sampling for Materials Scientists - NanoScope Services Ltd®

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Micromachines, Free Full-Text

Materials, Free Full-Text

Micromachines, Free Full-Text

Ex situ lift-out With a Benchtop Micromanipulator - Barnett

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

A lamella (also known as a foil or membrane) prepared for Lift-Out

ARES, Research, Laboratories

Focused ion beam (FIB) in situ lift-out (INLO) technique showing the

Method to prepare a plan-view specimen from a specific site based