By A Mystery Man Writer
Focused ion beam (FIB) in situ lift-out (INLO) technique showing the
Focused Ion Beam - CIME - EPFL
Focused Ion Beam Technology - an overview
Focused ion beam (FIB) in situ lift-out (INLO) technique showing the
Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy
focused ion-beam milling, FIB, Glossary
Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy
FIB milling with liftout
Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy
Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering